Utilização de equipamentos automaticos de teste em circuitos integrados digitais

doi:https://doi.org/10.47749/t/unicamp.1994.81414

Open AccessDissertation10.47749/t/unicamp.1994.81414

Utilização de equipamentos automaticos de teste em circuitos integrados digitais

Rogerio Lara Leite-1994-09-27

TL;DRAbstract

This work comments some important aspects of the digital integrated circuit automatic test. It presents the most common electrical tests done by an Automatic Test Equipment -ATE.

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This work comments some important aspects of the digital integrated circuit automatic test. It presents the most common electrical tests done by an Automatic Test Equipment -ATE.

Keywords

Automatic test equipmentComputer scienceTest (biology)Pascal (unit)Reliability engineeringEngineeringProgramming language

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