Article10.1016/j.microrel.2015.06.047

Probabilistic analysis of dynamic and temporal fault trees using accurate stochastic logic gates

Elham Cheshmikhani,Hamid R. Zarandi-2015-07-26-Microelectronics Reliability

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Keywords

Probabilistic CTLProbabilistic logicFault tree analysisComputer scienceTemporal logicAlgorithmMarkov chainExponential function

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