Electrostatic Force Microscopy Characterization of Low Dimensional Systems

doi:https://doi.org/10.1007/978-3-642-22566-6_9

Book Chapter10.1007/978-3-642-22566-6_9

Electrostatic Force Microscopy Characterization of Low Dimensional Systems

Yoichi Miyahara,Lynda Cockins,Peter Grütter-2011-09-20-Springer series in surface sciences

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Keywords

Kelvin probe force microscopeElectrostatic force microscopeScanning gate microscopyHeterojunctionMicroscopyScanning probe microscopyCharacterization (materials science)Materials science

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