Online low-cost defect tolerance solutions for microprocessor designs
TL;DRAbstract
One of the major driving forces of the semiconductor industry is the continuous scaling of the silicon process technology. Over the last four decades, the scaling into a new silicon technology every few years offered smaller and faster transistors that made possible the development of high-performance microprocessors. This technological achievement fueled the widespread adoption of microprocessor-based products in applications that touch every aspect of our life. However, many device experts warn that the continued transistor size scaling into smaller dimensions will inevitably result in silicon technologies that are much less reliable than the current ones. Microprocessors manufactured in future silicon technologies will likely experience failures due to silicon defects. In the absence of any viable alternative technology, the success of the semiconductor industry in the future will depend on the creation of cost-effective mechanisms to tolerate silicon defects while the microprocesso
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One of the major driving forces of the semiconductor industry is the continuous scaling of the silicon process technology. Over the last four decades, the scaling into a new silicon technology every few years offered smaller and faster transistors that made possible the development of high-performance microprocessors. This technological achievement fueled the widespread adoption of microprocessor-based products in applications that touch every aspect of our life. However, many device experts warn that the continued transistor size scaling into smaller dimensions will inevitably result in silicon technologies that are much less reliable than the current ones. Microprocessors manufactured in future silicon technologies will likely experience failures due to silicon defects. In the absence of any viable alternative technology, the success of the semiconductor industry in the future will depend on the creation of cost-effective mechanisms to tolerate silicon defects while the microprocesso
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