Book Chapter10.1007/978-3-319-04063-9_9

An Introduction to Trapped Ions, Scalability and Quantum Metrology

Alastair G. Sinclair-2014-01-01

10

Chat with Paper

AI Agents for this Paper

No abstract available for this paper.

Keywords

ScalabilityMetrologyQuantum metrologyIonQuantumComputer sciencePhysicsEngineering physics

Chat

Click to start Chat