Article10.1023/a:1012374313494

In situConductance Measurement of Surface Phases on Silicon by the Four-Probe Method

I. A. Belous,O. V. Utas,D. A. Tsukanov,V.G. Lifshits-2001-09-01-Instruments and Experimental Techniques

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Keywords

Materials scienceSiliconConductanceOptoelectronicsSystem of measurementOpticsPhysics

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