Problem of ensuring metrological reliability of measuring instruments

doi:https://doi.org/10.1007/bf00824475

Article10.1007/bf00824475

Problem of ensuring metrological reliability of measuring instruments

P. V. Novitskii-1977-02-01-Measurement Techniques

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Keywords

MetrologyReliability (semiconductor)Reliability engineeringMeasuring instrumentScientific instrumentComputer scienceBiochemical engineeringProcess engineering

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