X-Ray Topography Using Synchrotron Radiation

TL;DRAbstract

X-ray diffraction topography is a widely used method to study crystal attice defects by visualization. The properties of synchrotron radiation relevant to topography methods extend tle possibilities of investigations. These properties are the following: a high intensity, a broad spectral range, a natural collimation a linear polarization in the horizontal plane, and a pulsed time structure. The appfication of synchrotron radiation to X-ray topographic studies is described and some recent examples of experiments are presented.

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