Near-field speckle-scanning-based x-ray imaging
44PDF
TL;DRAbstract
A method capable of accessing the ultra-small-angle x-ray-scattering distribution of a sample from two-dimensional raster scans is developed, which promises to have applications in various fields of material science as well as biological imaging.
Chat with Paper
AI Agents for this Paper
A method capable of accessing the ultra-small-angle x-ray-scattering distribution of a sample from two-dimensional raster scans is developed, which promises to have applications in various fields of material science as well as biological imaging.
Keywords
Speckle patternDeconvolutionOpticsSynchrotronScatteringSIGNAL (programming language)Sample (material)Field (mathematics)
Chat
Click to start Chat