Electrical and Optical Characterization of Nanostructures

TL;DRAbstract

The characterization of nanostructures is a topic of vital interest, since the dimensions of commercially available semiconductor devices are now in a range, where quantum size effects become evident. In this paper, various methods are presented to characterize low-dimensional structures. Magnetic depopulation, tunneling, far infrared transmission, photo-conductivity and magnetophonon resonances are used to determine the low-dimensional subband energies. For each method, the special features are discussed and it is demonstrated that the different methods yield dicherent, complementary information.

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