Progress in Scanning Transmission Electron Microscopy at the University of Chicago

doi:https://doi.org/10.1007/978-3-322-86362-1_2

Progress in Scanning Transmission Electron Microscopy at the University of Chicago

A. V. Crewe,M. Isaacson,E. Zeitler-1979-01-01

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TL;DRAbstract

The purpose of this article is to inform the reader, in general terms, of the progress in scanning transmission electron microscopy at our institution. It is not our intent that this be a critically technical paper but, rather, one in which we summarize some of the developments in electron microscopy at the University of Chicago over the past few years. For more detailed discussion, the interested reader can refer to the cited literature.

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The purpose of this article is to inform the reader, in general terms, of the progress in scanning transmission electron microscopy at our institution. It is not our intent that this be a critically technical paper but, rather, one in which we summarize some of the developments in electron microscopy at the University of Chicago over the past few years. For more detailed discussion, the interested reader can refer to the cited literature.

Keywords

Scanning transmission electron microscopyTransmission electron microscopyNanotechnologyInstitutionEngineering physicsMaterials scienceLibrary scienceComputer science

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