Infrared Stark Effect Spectroscopy for Interface Characterization

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Abstract : The aim of this project is to develop a technique that can be used to obtain information concerning the formation of chemical bonds, which relate to adhesion strength, at interfaces. The technique being developed is based on the application of a large electric field in the interface region of a multiplayer structure, and then using the field to Stark shift the infrared signals from the chemical bonds between the layers. Much of the work conducted over this report period was focused on improving the signal-to-noise ratio performance of the Stark shift infrared spectrometer. Significant noise sources were identified and a new interleaved operational mode of the spectrometer implemented that avoids the largest of the noise components. We also discuss the use of an epitaxially grown layer of silicon as an adhesion layer for structures consisting of a silica sol-gel film on a crystalline germanium substrate. The very thin silicon layer does not measurably affect the optical prope

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