Book Chapter10.1016/b978-0-08-037890-9.50503-2

LOCAL MICRO-DEFORMATION ANALYSIS BY MEANS OF MICROGRID AND ELECTRON BEAM MOIRÉ FRINGE METHOD

Shinji Kishimoto,Mitsuru Egashira,N. Shinya,R.A. Carolan-1992-01-01-Elsevier eBooks

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Keywords

Scanning electron microscopeMaterials scienceMoiré patternCathode rayOpticsElectron-beam lithographyComposite materialDeformation (meteorology)

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