Parameter estimation methods based on binary observations - Application to Micro-Electromechanical Systems (MEMS)

TL;DRAbstract

While the characteristic dimensions of electronic systems scale down to micro- or nano-world, their performance is greatly influenced. Micro-fabrication process or variations of the operating situation such as temperature, humidity or pressure are usual cause of dispersion. Therefore, it seems essential to co-integrate self-testing or self-adjustment routines for these microdevices. For this feature, most existing system parameter estimation methods are based on the implementation of high-resolution digital measurements of the system's output. Thus, long design time and large silicon areas are needed, which increases the cost of the micro-fabricated devices. The parameter estimation problems based on binary outputs can be introduced as alternative self-test identification methods, requiring only a 1-bit Analog-to-Digital Converter (ADC) and a 1-bit Digital-to-Analog Converter (DAC).In this thesis, we propose a novel recursive identification method to the problem of system parameter est

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