Quantitative STEM normalisation: The importance of the electron flux
Gerardo Martínez,Lewys Jones,Annick De Backer,Armand Béché,Johan Verbeeck,Sandra Van Aert+1 more-2015-08-01-Ultramicroscopy
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Keywords
DetectorOpticsWeightingPhysicsElectronMetric (unit)Flux (metallurgy)Field emission gun
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