Article10.1023/a:1008973231053
Probabilistic strength of {1 1 1} n-type silicon
Andrew A. Wereszczak,A. S. Barnes,Kristin Breder,Sukhminder Binapal-2000-06-01-Journal of Materials Science Materials in Electronics
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Keywords
Weibull distributionMaterials scienceUltimate tensile strengthComposite materialFractographyWeibull modulusStress (linguistics)Bending
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