Article10.1016/j.ultramic.2015.07.007

A scanning microscopy technique based on capacitive coupling with a field-effect transistor integrated with the tip

Kumjae Shin,Dae sil Kang,Sang hoon Lee,Wonkyu Moon-2015-07-26-Ultramicroscopy

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Keywords

Materials scienceCapacitive couplingCapacitanceElectric fieldOptoelectronicsTransistorDielectricField-effect transistor

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