On the Reliability of Deteriorating Structures

doi:https://doi.org/10.1007/978-94-009-6896-7_18

Book Chapter10.1007/978-94-009-6896-7_18

On the Reliability of Deteriorating Structures

G. F. Oswald,G.I. Schuëller-1983-01-01

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Keywords

Reliability (semiconductor)Structural engineeringReliability engineeringLimit (mathematics)Range (aeronautics)Failure mechanismMaterials scienceForensic engineering

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