Conduction mechanisms deduced from thermoelectric power and direct-current conductivity measurements in co-evaporated Mn/SiOx thin films

doi:https://doi.org/10.1023/a:1018660305138

Article10.1023/a:1018660305138

Conduction mechanisms deduced from thermoelectric power and direct-current conductivity measurements in co-evaporated Mn/SiOx thin films

S. Z. A. Zaidi,J. Beynon,C. B. Steele-1997-12-01-Journal of Materials Science

0

Chat with Paper

AI Agents for this Paper

No abstract available for this paper.

Keywords

Materials scienceSeebeck coefficientAtmospheric temperature rangeConductivityDelocalized electronThermal conductionThermoelectric effectElectrical resistivity and conductivity

Chat

Click to start Chat