Study of the processes of background formation in the long-wavelength region of X-Ray spectrum

doi:https://doi.org/10.1134/s1061934815080055

Article10.1134/s1061934815080055

Study of the processes of background formation in the long-wavelength region of X-Ray spectrum

Elena V. Chuparina,А. Н. Смагунова,L. A. Eliseeva-2015-07-23-Journal of Analytical Chemistry

6

TL;DRAbstract

Using mathematical design of experiments we studied the spectral composition of an X-ray background in the wavelength region 0.3–1.2 nm in the X-ray fluorescence analysis (XRF) of samples with matrices composed of elements with small atomic numbers, viz plant materials. The interpretation of the results allowed us to quantitatively estimate components of X-ray background for spectrometers with wavelength dispersion and to reveal their dependence on the chemical composition of the specimens. Recommendations are formulated for the account of the background in the plant XRF.

Chat with Paper

AI Agents for this Paper

Using mathematical design of experiments we studied the spectral composition of an X-ray background in the wavelength region 0.3–1.2 nm in the X-ray fluorescence analysis (XRF) of samples with matrices composed of elements with small atomic numbers, viz plant materials. The interpretation of the results allowed us to quantitatively estimate components of X-ray background for spectrometers with wavelength dispersion and to reveal their dependence on the chemical composition of the specimens. Recommendations are formulated for the account of the background in the plant XRF.

Keywords

WavelengthChemistryChemical compositionAnalytical Chemistry (journal)X-ray fluorescenceSpectrometerSpectral lineDispersion (optics)

Chat

Click to start Chat