Article10.1023/a:1021877415290
Study of a Pure-Ge/Si Short-Period Superlattice by X-Ray Double Crystal Diffraction
Zhenguo Ji,Huanming Lu,Shiguo Zhang,Duanlin Que,Noritaka Usami,H. Sunamura+1 more-1999-05-01-Journal of Materials Synthesis and Processing
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Keywords
PhotoluminescenceMaterials scienceMolecular beam epitaxySuperlatticeDiffractionDislocationWavinessCrystallography
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