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Open AccessReport10.15760/etd.2330

Post-silicon Functional Validation with Virtual Prototypes

Kai Cong-2000-01-01

TL;DRAbstract

Post-silicon validation has become a critical stage in the system-on-chip (SoC) development cycle, driven by increasing design complexity, higher level of integration and decreasing time-to-market. According to recent reports, post-silicon validation effort comprises more than 50% of the overall development effort of an 65nm SoC. Though post-silicon validation covers many aspects ranging from electronic properties of hardware to performance and power consumption of whole systems, a central task remains validating functional correctness of both hardware and its integration with software. There are several key challenges to achieving accelerated and low-cost post-silicon functional validation. First, there is only limited silicon observability and controllability; second, there is no good test coverage estimation over a silicon device; third, it is difficult to generate good post-silicon tests before a silicon device is available; fourth, there is no effective software robustness testing

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Post-silicon validation has become a critical stage in the system-on-chip (SoC) development cycle, driven by increasing design complexity, higher level of integration and decreasing time-to-market. According to recent reports, post-silicon validation effort comprises more than 50% of the overall development effort of an 65nm SoC. Though post-silicon validation covers many aspects ranging from electronic properties of hardware to performance and power consumption of whole systems, a central task remains validating functional correctness of both hardware and its integration with software. There are several key challenges to achieving accelerated and low-cost post-silicon functional validation. First, there is only limited silicon observability and controllability; second, there is no good test coverage estimation over a silicon device; third, it is difficult to generate good post-silicon tests before a silicon device is available; fourth, there is no effective software robustness testing

Keywords

ObservabilityComputer scienceControllabilityRobustness (evolution)Embedded systemSiliconSoftwareReliability engineering

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