Open AccessReport10.2172/4734910

A FORTRAN IV PROGRAM FOR ELLIPSOMETER MEASUREMENTS OF SURFACE FILMS.

R. W. Loser,D.T. Larson-1969-01-01

2

Chat with Paper

AI Agents for this Paper

No abstract available for this paper.

Keywords

FortranEllipsometrySurface (topology)Programming languageComputer scienceMaterials scienceMathematicsNanotechnology

Chat

Click to start Chat