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FEATURE OF DEFECT FORMATION IN HOMOEPITAXIAL STRUCTURES GaAs UNDER CONDITIONS OF THERMAL SIGN CHANGE EFFECT AND LOCAL DEVIATION FROM THE STOICHIOMETRY

Alexander Kalinin,Michael Milvidsky,A. A. Shlensky,T. G. Yugova-1990-01-01-Defect Control in Semiconductors
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Keywords

Sign (mathematics)StoichiometryMaterials scienceFeature (linguistics)ThermalCondensed matter physicsChemistryPhysics

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