Combined Characterization of Nanostructures by AEM and STM

doi:https://doi.org/10.1007/978-3-7091-6555-3_36

Book Chapter10.1007/978-3-7091-6555-3_36

Combined Characterization of Nanostructures by AEM and STM

Vladimir P. Oleshko,R. Gijbels,Wim Jacob,М. В. Алфимов-1996-01-01

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Keywords

Scanning tunneling microscopeElectron energy loss spectroscopyMaterials scienceCharacterization (materials science)SpectroscopyScanning electron microscopeFermi levelAnalytical Chemistry (journal)

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