Measurement of the Rise-Time in a Single Sided Ladder Detector

TL;DRAbstract

In this note we report on the measurement of the preamplifier output rise time for a SVXII chip mounted on a D0 single sided ladder. The measurements were performed on the ladder 001-883-L, using the laser test stand of Lab D. The rise time was measured for different values of the response (or bandwidth) of the preamplifier. As a bigger bandwidth results in longer rise times and therefore in less noise, the largest possible bandwidth consistent with the time between bunch crossings should be chosen to operate the detectors. The rise time is defined as the time elapsed between 10% and 90% of the charge is collected. It is also interesting to measure the time for full charge collection and the percentage of charge collected in 132 ns and 396 ns. The results are shown in table 1, for bandwidths between 2 and 63 (binary numbers). The uncertainty on the time measurement is considered to be {approx} 10 ns. Figure 1 schematically defines the four quantities measured: rise time, time of full c

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