Optimisation of deposition conditions for functional oxide thin films
TL;DRAbstract
This chapter describes a systematic approach to determining the optimal conditions required to deposit thin films of complex functional oxides using RF magnetron sputtering. The motivation of this study was to attain films of designed stoichiometry and of preferentially oriented perovskite crystal structure, as the composition and structure of complex oxide determines their functionality (eg. ferroelectricity, piezoelectricity, etc) which is exploited by a variety of applications.
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This chapter describes a systematic approach to determining the optimal conditions required to deposit thin films of complex functional oxides using RF magnetron sputtering. The motivation of this study was to attain films of designed stoichiometry and of preferentially oriented perovskite crystal structure, as the composition and structure of complex oxide determines their functionality (eg. ferroelectricity, piezoelectricity, etc) which is exploited by a variety of applications.
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