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X-ray diffraction and Raman scattering study of Cr-doped ZnFe2O4 spinel ferrites

Ashwini Kumar,Poorva Sharma,Dinesh Varshney-2015-01-01-AIP conference proceedings
1

TL;DRAbstract

XRD and Raman scattering measurements were made on polycrystalline ZnFe2-xCrxO4 (x=0.0, 0.1, 0.2) spinel ferrites as prepared by solid-state reaction route. Rietveld refined X-ray diffraction pattern confirmed the formation of single-phase and are indexed in cubic structure with Fd3m space group. Slight reduction in the lattice parameter from 8.435 to 8.410 Ǻ, with Cr3+ ion substitution has been observed. From Raman scattering spectra, the modes of ZnFe1.9Cr0.1O4 and ZnFe1.8Cr0.2O4 are shifted towards the lower frequency side as compared to ZnFe2O4, this red shift is attributed to higher atomic mass of Zn (65.39 amu) as compared to Fe (55.84 amu).

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XRD and Raman scattering measurements were made on polycrystalline ZnFe2-xCrxO4 (x=0.0, 0.1, 0.2) spinel ferrites as prepared by solid-state reaction route. Rietveld refined X-ray diffraction pattern confirmed the formation of single-phase and are indexed in cubic structure with Fd3m space group. Slight reduction in the lattice parameter from 8.435 to 8.410 Ǻ, with Cr3+ ion substitution has been observed. From Raman scattering spectra, the modes of ZnFe1.9Cr0.1O4 and ZnFe1.8Cr0.2O4 are shifted towards the lower frequency side as compared to ZnFe2O4, this red shift is attributed to higher atomic mass of Zn (65.39 amu) as compared to Fe (55.84 amu).

Keywords

SpinelRaman scatteringRaman spectroscopyCrystalliteDiffractionRietveld refinementDopingMaterials science

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