Book Chapter10.1007/1-4020-3013-4_12

Reliability and Electrical Fluctuations in Advanced SOI CMOS Devices

J. Jomaah,F. Balestra-2005-08-01

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Keywords

Silicon on insulatorCMOSReliability (semiconductor)Electrical engineeringElectronic engineeringNoise (video)EngineeringOptoelectronics

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