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最小相关度的多捕获(Multi-capture)扫描测试结构

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A Multi-capture scan testing based on Minimum Relativity chain structure is proposed in this paper to compact the larger and larger test patterns. The scan chain organization is optimized to achieve higher fault coverage with little ATE vectors. A new test vector generation method for Multi-capture structure is presented to generate more efficient vectors. Experiments with ISCAS'89 benchmarks demonstrate its high compact ratio up to 90%.

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A Multi-capture scan testing based on Minimum Relativity chain structure is proposed in this paper to compact the larger and larger test patterns. The scan chain organization is optimized to achieve higher fault coverage with little ATE vectors. A new test vector generation method for Multi-capture structure is presented to generate more efficient vectors. Experiments with ISCAS'89 benchmarks demonstrate its high compact ratio up to 90%.

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