A methodologic project to characterize and model COTS component reliability

doi:https://doi.org/10.1016/j.microrel.2015.06.140

Open AccessArticle10.1016/j.microrel.2015.06.140

A methodologic project to characterize and model COTS component reliability

André Durier,A. Bensoussan,M. Zerarka,Chaimae Ghfiri,Alexandre Boyer,H. Frémont-2015-07-18-Microelectronics Reliability

5

Chat with Paper

AI Agents for this Paper

No abstract available for this paper.

Keywords

DependabilityCommercial off-the-shelfAutomotive industryComponent (thermodynamics)Robustness (evolution)Reliability (semiconductor)Space industryReliability engineering

Chat

Click to start Chat