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Topotactic changes on η-Mo4O11 caused by biased atomic force microscope tip and cw-laser

Miloš Borovšak,P. Šutar,Evgeny Goreshnik,D. Mihailović-2015-08-01-Applied Surface Science
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Keywords

LaserAtomic force microscopyRaman spectroscopyKelvin probe force microscopeOpticsMolybdenumMicroscopeMaterials science

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