Article10.1016/j.micron.2015.07.003
Quantitative characterization of the interface roughness of (GaIn)As quantum wells by high resolution STEM
Haoxue Han,Andreas Beyer,K. Jandieri,Katharina Gries,Lennart Duschek,W. Stolz+1 more-2015-07-26-Micron
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Keywords
Quantum wellMaterials scienceIndiumScanning transmission electron microscopySurface finishOptoelectronicsSurface roughnessEpitaxy
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