Book Chapter10.1007/978-3-642-54236-7_14

Reliability Evaluation for Mechatronic Equipment Truncation Life Data Based on the Weibull Distribution Model

Ruixiang Zhou,Jin Zhang,Bolin Shang-2014-01-01-Lecture notes in electrical engineering

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Keywords

Weibull distributionReliability engineeringReliability (semiconductor)Truncation (statistics)MechatronicsComputer scienceEngineeringStatistics

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