Life expectancy and characterization of capacitive RF MEMS switches
2010 · Microelectronics Reliability · 22 citations
https://doi.org/10.1016/j.microrel.2010.07.064
IRT M2P(FR)
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13
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50
Citations
4
h-index
2
i10-index
M. Matmat is an academic researcher from IRT M2P. The author has contributed to research in topics: GaN-based semiconductor devices and materials & Advanced MEMS and NEMS Technologies & Semiconductor materials and devices. The author has an h-index of 4, co-authored 12 publications.
https://doi.org/10.1016/j.microrel.2010.07.064
https://doi.org/10.1016/j.microrel.2009.06.049
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