Defect detection on semiconductor wafer surfaces
2004 · Microelectronic Engineering · 174 citations
https://doi.org/10.1016/j.mee.2004.12.003
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
20
Papers
296
Citations
7
h-index
5
i10-index
N.G. Shankar is an academic researcher from Amrita Vishwa Vidyapeetham. The author has contributed to research in topics: Industrial Vision Systems and Defect Detection & Image and Object Detection Techniques & Image Processing Techniques and Applications. The author has an h-index of 7, co-authored 17 publications.
Click to start Chat