Defect detection on semiconductor wafer surfaces
2004 · Microelectronic Engineering · 174 citations
https://doi.org/10.1016/j.mee.2004.12.003
Z
Z.W. Zhong
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389
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Z.W. Zhong is an academic researcher from South China Agricultural University. The author has contributed to research in topics: Advanced Surface Polishing Techniques & Advanced machining processes and optimization & Electronic Packaging and Soldering Technologies. The author has an h-index of 48, co-authored 331 publications.
ORCID: 0000-0002-0762-3580Papers by this author
worksRecent Advances in Polishing of Advanced Materials
2008 · Materials and Manufacturing Processes · 106 citations
https://doi.org/10.1080/10426910802103486
Evolutionary in Solid State Recycling Techniques of Aluminium: A review
2016 · Procedia CIRP · 72 citations
https://doi.org/10.1016/j.procir.2016.01.117
Environmental Impacts of Three Polyhydroxyalkanoate (PHA) Manufacturing Processes
2009 · Materials and Manufacturing Processes · 44 citations
https://doi.org/10.1080/10426910902740120
Localization of Tea Shoots for Robotic Plucking Using Binocular Stereo Vision
2025 · Journal of Field Robotics · 3 citations
https://doi.org/10.1002/rob.22559
The diagnostic and predictive value of LncRNA PANDAR in gastric cancer and its regulation of gastric cancer progression via miR-637
2025 · Hereditas · 1 citations
https://doi.org/10.1186/s41065-025-00511-7
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