Robustness of electron charge shuttling: Architectures, pulses, charge defects, and noise thresholds
2025 · Physical review. B./Physical review. B · 3 citations
https://doi.org/10.1103/physrevb.111.195302
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M.J. Jeon is an academic researcher from University of Oxford. The author has contributed to research in topics: Plasma Diagnostics and Applications & Thin-Film Transistor Technologies & Advanced Optical Imaging Technologies. The author has an h-index of 5, co-authored 15 publications.
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