Direct measurement of sidewall roughness of polymeric optical waveguides
2004 · Applied Surface Science · 15 citations
https://doi.org/10.1016/j.apsusc.2004.06.019
V
V. Lim
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
9
Papers
32
Citations
3
h-index
1
i10-index
V. Lim is an academic researcher from Raffles Institution. The author has contributed to research in topics: Photonic and Optical Devices & Semiconductor materials and devices & Semiconductor Lasers and Optical Devices. The author has an h-index of 3, co-authored 8 publications.
Papers by this author
worksEffect of process parameters on sidewall roughness in polymeric optical waveguides
2004 · Thin Solid Films · 8 citations
https://doi.org/10.1016/j.tsf.2004.05.065
Development of Backside Scanning Capacitance Microscopy Technique for Advanced SOI Microprocessors
2006 · Proceedings - International Symposium for Testing and Failure Analysis · 4 citations
https://doi.org/10.31399/asm.cp.istfa2006p0094
Application of conductive atomic force microscopy to study the in-line electrical defects
2008 · 3 citations
https://doi.org/10.1109/ipfa.2008.4588173
Retrieval of reflectivity in a networked radar environment
2004 · 1 citations
https://doi.org/10.1109/igarss.2004.1369056
Artificial Neural Network (ANN) Modeling to Forecast the Solar Radiation on Vertical Planes in Thailand
2024 · 1 citations
https://doi.org/10.1109/icbir61386.2024.10875731
Research topics
topicsChat about Author
Papers
Chat
Click to start Chat