Angular and Spatially Resolved Secondary Electron Yield Measurements of Thin Films and Structured Materials
2026 · IEEE Transactions on Instrumentation and Measurement · 0 citations
https://doi.org/10.1109/tim.2026.3665961
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
0
Papers
0
Citations
Isabel González Díaz-Palacio is an academic researcher.
Click to start Chat