Ampere-class double pulse testing of half-inch H-terminated diamond MOSFET chip
2025 · Applied Physics Express · 3 citations
https://doi.org/10.35848/1882-0786/adba3a
Honda (Japan)(JP)
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Keita Takaesu is an academic researcher from Honda (Japan). The author has contributed to research in topics: VLSI and Analog Circuit Testing & Electrostatic Discharge in Electronics & Integrated Circuits and Semiconductor Failure Analysis. The author has an h-index of 1, co-authored 1 publications.
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