Dimensional Crossover and Topological Nature of the Thin Films of a Three-Dimensional Topological Insulator by Band Gap Engineering
2019 · Nano Letters · 29 citations
https://doi.org/10.1021/acs.nanolett.9b01641
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
28
Papers
413
Citations
10
h-index
11
i10-index
Xiangnan Xie is an academic researcher from National University of Defense Technology. The author has contributed to research in topics: Topological Materials and Phenomena & Graphene research and applications & 2D Materials and Applications. The author has an h-index of 10, co-authored 24 publications.
https://doi.org/10.1021/acs.nanolett.9b01641
https://doi.org/10.1021/acs.nanolett.1c04756
https://doi.org/10.1088/1361-6463/ae1241
Click to start Chat