Stacked nanosheet gate-all-around transistor to enable scaling beyond FinFET
2017 · 939 citations
https://doi.org/10.23919/vlsit.2017.7998183
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Terence B. Hook is an academic researcher from IBM (United States). The author has contributed to research in topics: Semiconductor materials and devices & Advancements in Semiconductor Devices and Circuit Design & Integrated Circuits and Semiconductor Failure Analysis. The author has an h-index of 30, co-authored 119 publications.
https://doi.org/10.23919/vlsit.2017.7998183
https://doi.org/10.1109/iedm.2016.7838334
https://doi.org/10.1109/ted.2020.2977734
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