An Updated Perspective of Single Event Gate Rupture and Single Event Burnout in Power MOSFETs
2013 · IEEE Transactions on Nuclear Science · 147 citations
https://doi.org/10.1109/tns.2013.2252194
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13
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Jeffrey L. Titus is an academic researcher. The author has contributed to research in topics: Semiconductor materials and devices & Radiation Effects in Electronics & Integrated Circuits and Semiconductor Failure Analysis. The author has an h-index of 9, co-authored 12 publications.
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