Sensitivity analysis of dipole layers at semiconductor interfaces
1995 · Journal of Electron Spectroscopy and Related Phenomena · 5 citations
https://doi.org/10.1016/0368-2048(94)02297-6
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SP Wilks is an academic researcher from University of Wales. The author has contributed to research in topics: Semiconductor Quantum Structures and Devices & Silicon Nanostructures and Photoluminescence & Semiconductor materials and interfaces. The author has an h-index of 1, co-authored 1 publications.
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