Single Event Upsets and Hot Pixels in digital imagers
2015 · 8 citations
https://doi.org/10.1109/dft.2015.7315133
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17
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101
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5
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Rohan Thomas is an academic researcher from Wayne State University. The author has contributed to research in topics: Radiation Effects in Electronics & CCD and CMOS Imaging Sensors & Infrared Target Detection Methodologies. The author has an h-index of 5, co-authored 15 publications.
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