Defect Inspection Techniques in SiC
2022 · Nanoscale Research Letters · 84 citations
https://doi.org/10.1186/s11671-022-03672-w
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10
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121
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h-index
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Yi-Yu Pan is an academic researcher from National Yang Ming Chiao Tung University. The author has contributed to research in topics: Thin-Film Transistor Technologies & ZnO doping and properties & Semiconductor materials and devices. The author has an h-index of 4, co-authored 9 publications.
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