Towards next-generation diagnostic pathology: AI-empowered label-free multiphoton microscopy
2024 · Light Science & Applications · 34 citations
https://doi.org/10.1038/s41377-024-01597-w
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Junlin Pan is an academic researcher from Beijing Normal University. The author has contributed to research in topics: Smart Cities and Technologies & Industrial Vision Systems and Defect Detection & Educational Innovations and Challenges. The author has an h-index of 5, co-authored 19 publications.
ORCID: 0000-0002-9004-4669https://doi.org/10.1038/s41377-024-01597-w
https://doi.org/10.1016/j.rineng.2025.106526
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