https://doi.org/10.1016/j.mfglet.2014.12.001
Jay Lee
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563
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72
h-index
243
i10-index
Jay Lee is an academic researcher from University of Southern California. The author has contributed to research in topics: Machine Fault Diagnosis Techniques & Fault Detection and Control Systems & Industrial Vision Systems and Defect Detection. The author has an h-index of 72, co-authored 479 publications.
ORCID: 0000-0002-4022-4274Papers by this author
workshttps://doi.org/10.1016/j.ymssp.2013.06.004
https://doi.org/10.1016/j.jsv.2005.03.007
https://doi.org/10.1109/access.2020.3042874
https://doi.org/10.1115/1.4047856
https://doi.org/10.1007/s10845-020-01685-9
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