Size-Dependent Electrochemical Performance Mediated by Stress-Induced Cracking in Zn<sub>2</sub>SnO<sub>4</sub> Electrodes
2024 · ACS Nano · 1 citations
https://doi.org/10.1021/acsnano.3c10144
Wuhan University(CN)
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
6
Papers
47
Citations
3
h-index
2
i10-index
Yuxuan Hou is an academic researcher from Wuhan University. The author has contributed to research in topics: Microstructure and mechanical properties & Semiconductor materials and interfaces & Advancements in Battery Materials. The author has an h-index of 3, co-authored 6 publications.
Click to start Chat